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Acta Crystallographica Section A: Foundations of Crystallography (1)
Journal of Applied Crystallography (1)
Nanoscale Research Letters (1)
Bernstorff, Sigrid (3)
Buljan, Maja (3)
Alves, Eduardo (1)
Bangert, Ursel (1)
Barradas, Nuno P (1)
Bogdanović-Radović, Iva (1)
Bogdanović-Radović, Ivančica (1)
Chahboun, Adil (1)
Dražić, Goran (1)
Gomes, Maria JM (1)
Holý, Václav (1)
Jakšić, Milko (1)
Karlušić, Marko (1)
Kashtiban, Reza J (1)
Pinto, Sara RC (1)
Radić, Nikola (1)
Rolo, Anabela G (1)
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Formation of swift heavy ion tracks on a rutile TiO2 (001) surface1
Journal of Applied Crystallography
Formation of ion tracks on a rutile TiO2 (001) surface after exposure to swift heavy ions under grazing incidence is studied using atomic force microscopy, grazing-incidence small-angle X-ray scattering and in situ time-of-flight elastic recoil detection analysis.
Nanostructuring of surfaces and two-dimensional materials using swift heavy ions offers some unique possibilities owing to the deposition of a large amount of energy localized within a nanoscale volume surrounding the ion trajectory. To fully exploit this feature, the morphology of nanostructures formed after ion impact has to be known in detail. In the present work the response of a rutile TiO2 (001) surface to grazing-incidence swift heavy ion irradiation is investigated. Surface ion tracks with the well known intermittent inner structure were successfully produced using 23 MeV I ions. Samples irradiated with different ion fluences were investigated using atomic force microscopy and grazing-incidence small-angle X-ray scattering. With these two complementary approaches, a detailed description of the swift heavy ion impact sites, i.e. the ion tracks on the surface, can be obtained even for the case of multiple ion track overlap. In addition to the structural investigation of surface ion tracks, the change in stoichiometry of the rutile TiO2 (001) surface during swift heavy ion irradiation was monitored using in situ time-of-flight elastic recoil detection analysis, and a preferential loss of oxygen was found.
swift heavy ions; ion tracks; TiO2; rutile; grazing-incidence small-angle X-ray scattering; GISAXS; atomic force microscopy; elastic recoil detection analysis
Grazing-incidence small-angle X-ray scattering: application to the study of quantum dot lattices
Acta Crystallographica Section A: Foundations of Crystallography
The modelling of grazing-incidence small-angle X-ray scattering (GISAXS) from three-dimensional quantum dot lattices is described.
The ordering of quantum dots in three-dimensional quantum dot lattices is investigated by grazing-incidence small-angle X-ray scattering (GISAXS). Theoretical models describing GISAXS intensity distributions for three general classes of lattices of quantum dots are proposed. The classes differ in the type of disorder of the positions of the quantum dots. The models enable full structure determination, including lattice type, lattice parameters, the type and degree of disorder in the quantum dot positions and the distributions of the quantum dot sizes. Applications of the developed models are demonstrated using experimentally measured data from several types of quantum dot lattices formed by a self-assembly process.
grazing-incidence small-angle X-ray scattering; GISAXS; quantum dot lattices; self-assembly
Low-temperature fabrication of layered self-organized Ge clusters by RF-sputtering
Pinto, Sara RC
Rolo, Anabela G
Barradas, Nuno P
Kashtiban, Reza J
Gomes, Maria JM
Nanoscale Research Letters
In this article, we present an investigation of (Ge + SiO2)/SiO2 multilayers deposited by magnetron sputtering and subsequently annealed at different temperatures. The structural properties were investigated by transmission electron microscopy, grazing incidence small angles X-ray scattering, Rutherford backscattering spectrometry, Raman, and X-ray photoelectron spectroscopies. We show a formation of self-assembled Ge clusters during the deposition at 250°C. The clusters are ordered in a three-dimensional lattice, and they have very small sizes (about 3 nm) and narrow size distribution. The crystallization of the clusters was achieved at annealing temperature of 700°C.
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