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1.  Modeling noncontact atomic force microscopy resolution on corrugated surfaces 
Summary
Key developments in NC-AFM have generally involved atomically flat crystalline surfaces. However, many surfaces of technological interest are not atomically flat. We discuss the experimental difficulties in obtaining high-resolution images of rough surfaces, with amorphous SiO2 as a specific case. We develop a quasi-1-D minimal model for noncontact atomic force microscopy, based on van der Waals interactions between a spherical tip and the surface, explicitly accounting for the corrugated substrate (modeled as a sinusoid). The model results show an attenuation of the topographic contours by ~30% for tip distances within 5 Å of the surface. Results also indicate a deviation from the Hamaker force law for a sphere interacting with a flat surface.
doi:10.3762/bjnano.3.26
PMCID: PMC3323912  PMID: 22496996
graphene; model; noncontact atomic force microscopy; SiO2; van der Waals

Results 1-1 (1)