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1.  Noncontact atomic force microscopy II 
doi:10.3762/bjnano.5.31
PMCID: PMC3999739  PMID: 24778950
atomic force microscopy, scanning force microscopy
2.  Advanced atomic force microscopy techniques 
doi:10.3762/bjnano.3.99
PMCID: PMC3554267  PMID: 23365802
atomic force microscopy
3.  Noncontact atomic force microscopy 
doi:10.3762/bjnano.3.17
PMCID: PMC3304310  PMID: 22428107
4.  Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction 
Summary
Noncontact atomic force microscopy (NC-AFM) is being increasingly used to measure the interaction force between an atomically sharp probe tip and surfaces of interest, as a function of the three spatial dimensions, with picometer and piconewton accuracy. Since the results of such measurements may be affected by piezo nonlinearities, thermal and electronic drift, tip asymmetries, and elastic deformation of the tip apex, these effects need to be considered during image interpretation.
In this paper, we analyze their impact on the acquired data, compare different methods to record atomic-resolution surface force fields, and determine the approaches that suffer the least from the associated artifacts. The related discussion underscores the idea that since force fields recorded by using NC-AFM always reflect the properties of both the sample and the probe tip, efforts to reduce unwanted effects of the tip on recorded data are indispensable for the extraction of detailed information about the atomic-scale properties of the surface.
doi:10.3762/bjnano.3.73
PMCID: PMC3458610  PMID: 23019560
atomic force microscopy; force spectroscopy; NC-AFM; three-dimensional atomic force microscopy; tip asymmetry; tip elasticity

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